American Journal of Energy Research
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American Journal of Energy Research. 2025, 13(3), 80-85
DOI: 10.12691/ajer-13-3-1
Open AccessArticle

Influence of the Magnetic Field and Optimum Base Thickness of a Series Vertical-Junction Silicon Solar Cell under Polychromatic Illumination and Magnetic Field on Capacitance: Determination of Transition and Dark Capacitances

Dibor FAYE1, , Pape DIOP1, Babou DIONE1 and Mamadou yacine BA1

1Physics Department, Faculty of Sciences and Technology, Laboratory of Semiconductors and Solar Energy, University Cheikh Anta Diop, Dakar, Sengal Country

Pub. Date: September 03, 2025

Cite this paper:
Dibor FAYE, Pape DIOP, Babou DIONE and Mamadou yacine BA. Influence of the Magnetic Field and Optimum Base Thickness of a Series Vertical-Junction Silicon Solar Cell under Polychromatic Illumination and Magnetic Field on Capacitance: Determination of Transition and Dark Capacitances. American Journal of Energy Research. 2025; 13(3):80-85. doi: 10.12691/ajer-13-3-1

Abstract

In this paper, we have studied the influence of the optimum thickness of the base of a series vertical-junction solar cell, under polychromatic illumination and magnetic field, on transition and dark capacitances. The expressions for minority carrier density, photovoltage, and capacitance are derived by solving the diffusion equation for minority carriers, based on boundary conditions involving recombination velocities at the junction (Sf) and in the back zone (Sb). The profile of capacitance versus photovoltage for each value of optimum thickness obtained from the magnetic field is then presented, in order to determine the value of transition and dark capacitances for each value of optimum thickness. The evolution of open-circuit photovoltage (Vco) as a function of magnetic field and optimum base thickness is described at the end.

Keywords:
vertical junction silicon solar cell series static regime magnetic field optimum thickness capacity

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References:

[1]  Diallo, H.L., Wereme, A., Maiga, A.S. and Sissoko, G. (2008). New approach of both junction and back surface recombination velocities in a 3D modelling study of a polycrystalline silicon solar cell. The European Physical Journal Applied Physics, 42, pp.203-211.
 
[2]  Stokes, E. D. and Chu, T. L. (1977). Diffusion Lengths in Solar Cells From Short-Circuit Current Measurements. Applied Physics Letters, Vol. 30, No8, pp.425-426.
 
[3]  Sissoko, G., Nanéma, E., Corréa, A., Biteye, P.M., Adj, M. and N’Diaye, A.L. (1998). Silicon Solar Cell Recombination Parameters Determination Using the Illuminated I-V Characteristic. World Renewable Energy Congress, Florence, 20-25 September 1998, 1847 1851.
 
[4]  Vardayan, R.R., Kerst, U., Wawer, P., Nell, M.N. and Wagemann, H.G (1998). Method of Measurement of All Recombination Parameters in the Base Region of Solar Cells. Proceedings of 2nd Conference and Exhibition on Photovoltaic Solar Energy Conversion, Vienna, 6-10 July 1998, 191-193.
 
[5]  Jung, T.-W., Lindholm, F.A. and Neugroschel, A. (1984). Unifying View of Transient Responses for Determining Lifetime and Surface Recombination Velocity in Silicon Diodes and Back-Surface-Field Solar Cells, with Application to Experimental Short-Circuit-Current Decay. IEEE Transactions on Electron Devices, 31, 588- 595.
 
[6]  Betse, Y., Ritte, D., Bahir, G., Cohen, S. and Sperling, J. (1995). Measurement of the minority carrier mobility in the base of heterojunction bipolar transistors using a magnetotransport method”, Appl. Phys. Lett., Vol. 67, No. 13, Pp. 1883-1884.
 
[7]  Diop, G., Ba, H. Y., Thiam, N., Traore, Y., Dione, B., Ba, M. A., Diop, P., Diop, M. S., Mballo, O. and Sissoko, G. (1019). Base thickness optimization of a vertical series junction silicon solar cell under magnetic field by the concept of back surface recombination velocity of minority carrier. ARPN Journal of Engineering and Applied Sciences, Vol. 14, No. 23, pp.4078 4085.
 
[8]  Faye, D., Gueye, S., Ndiaye, M., Ba, M. L., Diatta, I., Traore, Y., Diop, M. S., Diop, G., Diao, A. and Sissoko, G. (2020). Lamella silicon solar cell under both temperature and magnetic field: width optimum determination. https:// www.scirp.org/ journal/ jemaa.
 
[9]  Flohr, Th. and Helbig, R. (1989). Determination of Minority-Carrier Lifetime and Surface Recombination Velocity by Optical-Beam Induced-Current Measurements at Different Light Wavelengths. Journal of Applied Physics, 66, 3060-3065.
 
[10]  Diop M.S., Ba H.Y., Thiam N., Diatta I., Traore Y., Ba M.L., Sow E.H., Mballo O. and Sissoko G. (2019). Surface Recombination Concept as Applied to Determinate Silicon Solar Cell Base Optimum Thickness with Doping Level Effect. World Journal of Condensed Matter Physics, 9, 102-111.
 
[11]  Gover, A. and Stella, P. (1974). Vertical Multijunction Solar-Cell One-Dimensional Analysis. IEEE.
 
[12]  Wise, J.F. (1970). Vertical Junction Hardened Solar Cell. US Patent 3, 690-953.
 
[13]  Terheiden, B., Hahn, G., Fath, P. and Bucher, E. (2000). The Lamella Silicon Solar Cell. 16th European Photovoltaic Solar Energy Conference, Glasgow, pp.1377-1380.
 
[14]  Hu, C., Carney, J.K. and Frank, R.I. (1977). New Analysis of a High Voltage Vertical Multijunction Solar Cell. Journal of Applied Physics, 48, 442-444.
 
[15]  Sarfaty, R., Cherkun, A., Pozner, R., Segev, G., Zeierman, E., Flitsanov, Y., Kribus, A. and Rosenwaks, Y. (2011). Vertical Junction Si Micro-Cells for Concentrating Photovoltaics. Proceedings of the 26th European Photovoltaic Solar Energy Conference and Exhibition, Hamburg, 5-6 September 2011, 145-147.
 
[16]  Furlan, J. and Amon, S. (1985). Approximation of the Carrier Generation Rate in Illuminated Silicon. Solid-State Electronics, 28, 1241 1243.
 
[17]  Sissoko, G., Museruka, C., Corréa, A., Gaye, I. and Ndiaye, A.L. (1996). Light Spectral Effect on Recombination Parameters of Silicon Solar Cell. World Renewable Energy Congress, Pergamon, Part III, pp.1487-1490.
 
[18]  Joardar, K., Dondero, R.C. and Schroda, D.K. (1989) A Critical Analysis of the Small- Signal Voltage-Decay Technique for Minority Carrier Lifetime Measurement in Solar Cells. Solid-State Electronics, 32, pp.479-483.
 
[19]  Sissoko, G., Sivoththanam, S., Rodot, M. and Mialhe, P (1992). Constant Illumination-Induced Open Circuit Voltage Decay (CIOCVD) Method, as Applied to High Efficiency Si Solar Cells for Bulk and Back Surface Characterization. 11 th European Photovoltaic Solar Energy Conference and Exhibition, Montreux, pp.352-354.
 
[20]  Rose, B.H. and Weaver, H.T. (1983). Determination of Effective Surface Recombination Velocity and MinorityCarrier Lifetime in High Efficiency Si Solar Cells. Journal of Applied Physics, 54, pp.238-247.
 
[21]  Fossum, J.G. (1977). Physical Operation of Back-Surface-Field Silicon Solar Cells. IEEE Transactions on Electron Devices, 2, pp.322 325.
 
[22]  Diasse, O., Diao, A., Ly, I., Diouf, M.S., Diatta, I., Mane, R.,Traore, Y and Sissoko, G. (2018), Back Surface Recombination Velocity Modeling in White Biased Silicon Solar Cell under Steady State. journal of Modern Physics, 9, 189-201.
 
[23]  MBODJI, S. (2009). Etude en modélisation de l’élargissement de la zone de charge d’espace et de la capacité de transition d’une photopile bifaciale au silicium polycristallin sous éclairement monochromatique constant. Thèse de 3ème Cycle, U.C.A.D, Dakar, Sénégal.
 
[24]  Böer, K. W. (2010). Introduction to Space Charge Effects in Semiconductors. Springer Series in Solid-State Sciences.
 
[25]  Mbodji, S., Mbow, B., Barro, F. I., & Sissoko, G. (2011). A 3D model for thickness and diffusion capacitance of emitter-base junction determination in a bifacial polycrystalline solar cell under real operating condition. Turk J Phys, 35, 281 – 291.
 
[26]  Mauro, P., Daren, P., Jai Prakash, S and al.(2021) The effect of capacitance on high-efficiency photovoltaic modules : a review of testing methods and related uncertainties, journal of Physics D :Appl.Phys. 54 193001.