Journal of Materials Physics and Chemistry
ISSN (Print): 2333-4436 ISSN (Online): 2333-4444 Website: https://www.sciepub.com/journal/jmpc Editor-in-chief: Prof. Dr. Alireza Heidari, Ph.D., D.Sc.
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Journal of Materials Physics and Chemistry. 2016, 4(1), 1-3
DOI: 10.12691/jmpc-4-1-1
Open AccessArticle

Optical and Electrical Properties Dependence on Thickness of Screen-Printed TiO2 Thin Films

D.L. Domtau1, 2, , J. Simiyu1, E.O. Ayieta1, B. Muthoka1 and J. M. Mwabora1

1Department of Physics, University of Nairobi, Nairobi, Kenya

2Department of Physics, University of Jos, Jos, Nigeria

Pub. Date: August 05, 2016

Cite this paper:
D.L. Domtau, J. Simiyu, E.O. Ayieta, B. Muthoka and J. M. Mwabora. Optical and Electrical Properties Dependence on Thickness of Screen-Printed TiO2 Thin Films. Journal of Materials Physics and Chemistry. 2016; 4(1):1-3. doi: 10.12691/jmpc-4-1-1

Abstract

Effect of film thickness on the optical and electrical properties of TiO2 thin films were studied. Thin films of different thicknesses were deposited by screen printing method on fluorine doped tin oxide coated on glass substrate. The film thickness was determined by surface profile measurement. The thicknesses were 3.2, 8.2, 13.5 and 18.9 µm. Transmittance, reflectance and absorbance spectra were studied using UV-VIS-NIR spectrophotometer in the photon wavelength range of 300-1500 nm for transmittance and reflectance and 350-1200 nm for absorbance. Band gap and refractive index of the films were determined using these spectra. It was found that reflectance, absorbance, band gap and refractive index increased with film thickness while transmittance decreased with increase in thickness. I-V characteristics of the films were also measured by a 4- point probe. Electrical resistivity (𝜌) and conductivity (σ) where calculated from the I-V values. Resistivity was found to increase with thickness while conductivity decreased with increase in film thickness.

Keywords:
TiO2 thin films thickness optical and electrical properties screen printing

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References:

[1]  M.E .Yang Juan, Sen and J.M.F. Ferreira Hydrothd, J.Am.Ceram.Soc. 84(8), 2001, 1696-1706.
 
[2]  H. Ru-bin and G. Lian,J.Mater Res Bull., 36, 2001, 1957-1965.
 
[3]  A. Otávio T. Patrocínio, Eucler B. Paniago, Roberto M. Paniago, Neyde Y. Murakami Iha, Appl. Surf. Sci 254 (2008) 1874-1879.
 
[4]  Ibrahim A. Al-Homoudi, J.S. Thakur, R. Naik, G.W. Auner, G. Newaz, , Appl. Surf. Sci 253 (2007) 8607-8614.
 
[5]  M.R. Hoffmann, S.T. Martin, W. Choi, D.W. Bahnemann, Chem. Rev. 95 (1995) 69-96.
 
[6]  X.Z. Li, H. Liu, L.F. Cheng, H.J. Tong, Environ. Sci. Technol. 37 (2003) 3989-3994.
 
[7]  R. Mechiakh, F. Meriche, R. Kremer, R. Bensaha, B. Boudine, A. Boudrioua , Optical Materials 30 (2007) 645-651.
 
[8]  S.H. Jeong, J.K. Kim, B.S Kim, S.H. Shim, B.T. Lee, Vacuum 76 (2004) 507-515.
 
[9]  Wenli Yang, Colin A. Wolden, Thin Solid Films 515 (2006) 1708-1713.
 
[10]  J. Rodriguez, M. Gomez, J. Ederth, G.A. Niklasson, C.G. Granqvist, Thin Solid Films 365(1), 119-125 (2000)
 
[11]  J.D. DeLoach, C.R. Aita, J. Vac. Sci. Technol. A 16, 1963-1968 (1998).
 
[12]  H. Kangarlou, S. Rafizadeh, (InTech, Rijeka, 2012). ISBN: 978-953-51-0576-3. http://www.intechopen.com/books/scanning-probe-microscopy-physical-property-characterizationat-nanoscale/influence-of-thickness-on-structural-and-opticalproperties-of-titanium-oxide-thin-layers.
 
[13]  M. Sreemany, S. Sen, Mater. Res. Bull. 42, 177-189 (2007).
 
[14]  F. Hanini, B. Bouabellou, Y. Bouachiba, F. Kermiche, A. Taabouche, M. Hemmissi, D. Lakhdari. Journal of Engineering 3(11), 21-28 (2013).
 
[15]  C. Kittel, “Introduction to Solid State Physics”, 7th edition, John Wiley and Sons, New York 1996.
 
[16]  J. Rodriguez, M. Gomez, J. Ederth, G.A. Niklasson, C.G. Granqvist, Thin Solid Films 365(1), 119-125 (2000).
 
[17]  L. Miao, S. Tanemura, M. Tanemura, S.P. Lau, B.K. Tay, J. Mater. Sci., Mater. Electron. 18(1), 343-346 (2007).
 
[18]  S. Aksay and B. Altioka., Phys.Sta.Sol(4), (2) 585-588.
 
[19]  Q.Y. Cai, Y.X. Zheng, P.H. Mao, R.J. Zhang, D.X. Zhang, M.H. Liu, L.Y. Chen, J. Phys. D, Appl. Phys. 43(44), 445302 (2010).
 
[20]  H.B. Wang, J.Y. Wang, J.H. Hong, Q.F. Wei, W.D. Gao, Z.F. Zhu, J. Coat. Technol. Res. 4(1), 101–106 (2007)
 
[21]  P.J. McMarr, J.R. Blanco, K. Vedam, R.Messier, L. Pilione, Appl. Phys. Lett. 49, 328 (1986).
 
[22]  S. Lee, S. Choi, S.G. Oh, J. Korean Phys. Soc. 34(1), 93-96(1999).
 
[23]  Z.J. Xu, F. Zhang, R.J. Zhang, X. Yu, D.X. Zhang, Z.Y. Wang, Y.X. Zheng, S.Y. Wang, H.B. Zhao, L.Y. Chen, Applied Physics A Material Science and Processing. Springer-Verlerg Berlin Heidelberg 2013.