American Journal of Electrical and Electronic Engineering
ISSN (Print): 2328-7365 ISSN (Online): 2328-7357 Website: https://www.sciepub.com/journal/ajeee Editor-in-chief: Naima kaabouch
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American Journal of Electrical and Electronic Engineering. 2013, 1(3), 60-63
DOI: 10.12691/ajeee-1-3-5
Open AccessArticle

By-emitter Emulation Enhancement Tool Using a Global Thermal Solver for the Degradation Emulation of a Calibrated 975 nm Tapered Laser Bar

Christian Kwaku Amuzuvi1, 2, , Joseph Cudjoe Attachie1 and Kofi Asante1

1Department of Electrical and Electronic Engineering, University of Mines and Technology, Tarkwa, Ghana

2Photonic and Radio Frequency Engineering Group (PRFEG), Electrical Systems and Optics Research Division, Faculty of Engineering, University of Nottingham, Nottingham, United Kingdom

Pub. Date: November 21, 2013

Cite this paper:
Christian Kwaku Amuzuvi, Joseph Cudjoe Attachie and Kofi Asante. By-emitter Emulation Enhancement Tool Using a Global Thermal Solver for the Degradation Emulation of a Calibrated 975 nm Tapered Laser Bar. American Journal of Electrical and Electronic Engineering. 2013; 1(3):60-63. doi: 10.12691/ajeee-1-3-5

Abstract

In this paper, Barlase has been taken a step further by emulating the degradation processes in high power semiconductor laser bars using an upgraded version of Barlase by the introduction of a global thermal solver to further deepen the understanding of the behaviour of laser bars. In this paper, the emulation of a real laser bar was investigated to emulate experimental results by simulating the experimental results in the view of finding a correlation between them. The results established show a more elaborate frown shaped power/current profile and a corresponding frown shaped temperature profile especially at the front facet of the laser bar. Even though a more elaborate frown shaped profile was realised in the power, current and temperature profiles, it fell short from what was seen in the experimental results. As the emulation of laser bar degradation has not been attempted before, further work is needed to achieve better agreement in the output power, current and temperature profiles to better the model.

Keywords:
by-emitter emitter calibration tapered laser bar power Heatsink temperature electroluminescence near infra-red degradation trap density

Creative CommonsThis work is licensed under a Creative Commons Attribution 4.0 International License. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/

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