Article citationsMore >>

M. Lee, S. Seo, D. Seo, E. Jeong, and I.K. Yoo, Integrated Ferroelectrics 68-19, (2012).

has been cited by the following article:

Article

Structural and Optical Properties of (LixNi2-xO2) Thin Films Deposited by Pulsed Laser Deposited (PLD) Technique at Different Doping Ratio

1Department of Physics, University of Tikrit, College of Education

2Department of Physics, University of Baghdad, College of Sciences


International Journal of Physics. 2017, Vol. 5 No. 2, 46-52
DOI: 10.12691/ijp-5-2-3
Copyright © 2017 Science and Education Publishing

Cite this paper:
Khalid. H. Razeg, Muthafar. F. AL-Hilli, Abed. A. Khalefa, Kadhim A. Aadim. Structural and Optical Properties of (LixNi2-xO2) Thin Films Deposited by Pulsed Laser Deposited (PLD) Technique at Different Doping Ratio. International Journal of Physics. 2017; 5(2):46-52. doi: 10.12691/ijp-5-2-3.

Correspondence to: Abed.  A. Khalefa, Department of Physics, University of Tikrit, College of Education. Email: abedkhalefa65@gmail.com

Abstract

This paper study (LixNi2-xO2) thin films with different value of x (x = 0.0, 0.15, 0.25, 0.35 and 0.45) prepared by pulse laser deposition technique (PLD) on a glass bases and annealed to (350°C). Using X-ray diffraction (XRD) and atomic force microscopy (AFM) to study the properties of synthetic and show that the (NiO) film has face centre cubic structure (fcc), while the (LixNi2-xO2) films of the ratio (0.15 to 0.45) has a hexagonal installation and grain size increase with the doping. Optical properties studied within the specified range of wavelengths (300-1100nm), it's found that the energy gap and transmittance decrease while absorbance and extinction coefficient increase with the doping.

Keywords