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<records>
  <record>
    <language>eng</language>
    <publisher>Science and Education Publishing</publisher>
    <journalTitle>Journal of Materials Physics and Chemistry</journalTitle>
    <eissn>2333-4444</eissn>
    <publicationDate>2024-09-05</publicationDate>
    <volume>12</volume>
    <issue>2</issue>
    <startPage>37</startPage>
    <endPage>41</endPage>
    <doi>10.12691/jmpc-12-2-3</doi>
    <publisherRecordId>JMPC20241223</publisherRecordId>
    <documentType>article</documentType>
    <title language="eng">Structural Characterization of P-type SnO2: Ga and Sb-co-doped SnO2:Ga Thin Films Prepared by Sol-Gel Dip-Coating Method for Potential Optoelectronic Applications</title>
    <authors>
      <author>
        <name>Sally Kemuma Gichana</name>
        <email>sallygichana22@gmail.com</email>
        <affiliationId>1</affiliationId>
      </author>
      <author>
        <name>David M. Mulati</name>
        <affiliationId>1</affiliationId>
      </author>
      <author>
        <name>Timonah N. Soitah</name>
        <affiliationId>1</affiliationId>
      </author>
    </authors>
    <affiliationsList>
      <affiliationName affiliationId="1">Department of Physics: Jomo Kenyatta University of Agriculture and Technology (JKUAT). P.O BOX 62000-00200, NAIROBI-KENYA</affiliationName>
    </affiliationsList>
    <abstract language="eng">This paper delves into the synthesis and characterization of p-type Transparent Conducting Oxides (TCOs), with a specific focus on Gallium-doped tin oxide (SnO2:Ga)and Antimony co-doped Gallium-tin oxide thin films. The films are deposited on blue microscope glass substrates utilizing the sol-gel dip-coating method. The study tackles the challenges related to the application of p-type TCOs, highlighting advancements in electrical performance compared to their n-type counterparts. Structural characterization through X-ray diffraction indicates both crystalline and amorphous nature of the films. Sharp and narrow diffraction peaks confirm the well-defined doped phases of Ga and Sb at atomic substitutional sites of SnO2. Different phases are identified for pure SnO2and Ga-doped SnO2 films. The preferential orientation shifts with doping concentrations. Sb-co-doped SnO2 films show the highest peak intensities. The average crystallite sizes of the thin films increase with doping concentrations, ranging from 19.83 nm to 32.24 nm for Ga-doped films and 33.91 nm to 40.88 nm for Sb-co-doped films. The structural analyses suggest that SnO2:Ga and Sb-co-doped SnO2:Ga thin films are suitable p-type TCO materials for optoelectronic applications. Overall, this research contributes valuable insights into improving the performance of p-type TCOs and addresses the limitations associated with their characterization.</abstract>
    <fullTextUrl format="pdf">https://pubs.sciepub.com/jmpc/12/2/3/jmpc-12-2-3.pdf</fullTextUrl>
    <keywords language="eng">
      <keyword>P-type</keyword>
      <keyword>Thin Films</keyword>
      <keyword>Sol-Gel</keyword>
      <keyword>Structural properties</keyword>
    </keywords>
  </record>
</records>