<?xml version="1.0" encoding="UTF-8"?>
<records>
<record>
<language>eng</language>
<publisher>Science and Education Publishing</publisher>
<journalTitle>International Journal of Physics</journalTitle>
<eissn>2333-4576</eissn>
<publicationDate>2025-09-25</publicationDate>
<volume>13</volume>
<issue>4</issue>
<startPage>105</startPage>
<endPage>111</endPage>
<doi>10.12691/ijp-13-4-3</doi>
<publisherRecordId>IJP20251343</publisherRecordId>
<documentType>article</documentType>
<title language="eng">Single and Multi-Layer Dielectric Structures, Basic Principles and Applications</title>
<authors>
<author>
<name>Fulvio Andres Callegari</name>
<email></email>
<affiliationId>1</affiliationId>
</author>
</authors>
<affiliationsList>
<affiliationName affiliationId="1">Centro de Engenharia, Modelagem, e Ci¨ºncias Sociais Aplicadas, Universidade Federal do ABC, Santo Andr¨¦, SP, Brasil. Avenida dos Estados, 5001 - Bairro Santa Terezinha Santo Andr¨¦ - CEP: 09210-580</affiliationName>

</affiliationsList>
<abstract language="eng">This work provides an overview of single and multilayer dielectric stacks and their applications, with focus on the fundamental physics of interference. This understanding is crucial for designing materials that can precisely manipulate reflected electromagnetic energy, either by maximizing or minimizing its value. Computational codes for studying single and multilayer dielectrics have been developed and validated by accurately reproducing results from the literature. These codes are user-friendly and can be used to explore new configurations for these devices.</abstract>
<fullTextUrl format="pdf">https://pubs.sciepub.com/ijp/13/4/3/ijp-13-4-3.pdf</fullTextUrl>
<keywords language="eng"><keyword>Interference</keyword>
<keyword>reflectance</keyword>
<keyword>single and multilayer dielectric films</keyword>
</keywords>
</record>
</records>
