eng Science and Education Publishing American Journal of Applied Mathematics and Statistics 2328-7292 2023-10-11 11 3 83 88 10.12691/ajams-11-3-1 AJAMS20231131 article DevaArul S deardeva@gmail.com 1 Arunthadhi N 2 Associate Professor & Head, Department of Statistics, Government Arts College (Autonomous), Coimbatore, Tamil Nadu, India. Research Scholar, Department of Statistics, Government Arts College (Autonomous), Coimbatore, Tamil Nadu, India. In this article a new control chart to monitor the compound fraction defectives is developed. The variability in the sample sizes and fraction defectives in the process are jointly monitored by using a single chart. The newly developed chart has good advantages over other charts by maintaining a single chart for two variable characteristics. This chart can monitor and control the fraction defectives in a process and at the same time will control the variability in the sample sizes. The ARL values are determined which is compared with other charts. It was found that the ARL of the proposed control chart better performed than the other control charts. http://pubs.sciepub.com/ajams/11/3/1/ajams-11-3-1.pdf Process Control control limits control charts compound defectives