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J. Sheen, “Amendment of cavity perturbation technique for loss tangent measurement at microwave frequencies,” Journal of applied physics, vol. 102, p. 014102, July2007.

has been cited by the following article:

Article

Wideband Characterization of Microstrip Technology with Borofloat 33 and Some Classic Transparent Glasses

1Institut d’Électronique et des Technologies du numéRique, Nantes, France

2Université des Sciences des Techniques et des Technologies de Bamako, Bamako, Mali


American Journal of Electrical and Electronic Engineering. 2023, Vol. 11 No. 1, 1-6
DOI: 10.12691/ajeee-11-1-1
Copyright © 2023 Science and Education Publishing

Cite this paper:
Abdoulaye Sissoko, Anne Chousseaud, Badié Diourté, Tchanguiz Razban, Marc Brunet, Stéphane Ginestar. Wideband Characterization of Microstrip Technology with Borofloat 33 and Some Classic Transparent Glasses. American Journal of Electrical and Electronic Engineering. 2023; 11(1):1-6. doi: 10.12691/ajeee-11-1-1.

Correspondence to: Abdoulaye  Sissoko, Institut d’Électronique et des Technologies du numéRique, Nantes, France. Email: abdoulaye.sissoko@isamali.org

Abstract

In this work, we made the technical qualification of borofloat 33 glass and also other much cheaper conventional glasses, associated with solid metallization by a broadband characterization method of microstrip technology based on the S-parameters. This made it possible to extract the electromagnetic parameters (dielectric permittivity, tangent loss) necessary for the design and construction of low visual impact antennas. The values of S11, S33, S12, and S34 are then extracted on vector network analyzer (VNA). The data of these measurement results are processed and the values of the loss tangent and the dielectric constant are thus measured with ADS software. We have obtained for the classical glass εr = 6.5 and tanδ = 0.0206; for the microscope glass εr = 6.15 and tanδ = 0.021 and at the end for the borofloat 33 glass εr = 4.5 and tanδ = 0.012.

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