eng Science and Education Publishing Journal of Materials Physics and Chemistry 2013-12-31 2 1 9 14 10.12691/jmpc-2-1-2 JMPC2014212 article A.M. Martínez anamartinez.tutora@gmail.com 1 M.R. Rosenberger 2 A.B. Trigubó 3 4 R.L. D´Elía 4 E.A. Heredia 4 CEDIT-CeDITec, Félix de Azara 1890 5o piso, Posadas, Pcia. de Misiones, Argentina IMAM-CONICET-UNaM, FEQYN, Félix de Azara 1552, Posadas, Pcia. de Misiones, Argentina FRBA-UTN, Medrano 951, CABA, Argentina Single crystals of Cd1-xZnxTe ( 0 ≤ x ≤ 0.1 ) (CZT/CdZnTe) are used in manufacture of gamma and X-ray detectors and as substrates for epitaxial growth of HgCdTe. Computer simulation for the solidification of CZT was performed using finite elements. The simulation results indicate that a lower translation speed of the quartz ampoule within the Bridgman furnace determines a lower concavity of the liquid interface which assures a good crystalline quality. When the rate is 3.32 mm/h the concavity is 58% greater than for a speed of 0.50 mm/h. It was experimentally found that when growing at low speed, 1.66 mm/h, the process is more stable and improves the crystalline quality due that only two grains were generated in CZT ingots. Meanwhile a faster growth speed- 3.32 mm/h- generates a large amount of grains in the CZT ingot. http://pubs.sciepub.com/jmpc/2/1/2/jmpc-2-1-2.pdf CdZnTeBridgman methodnumerical simulationfinite element methodsingle crystal growthII-VI Semiconductors