TY  - JOUR
T1  - The Faults Diagnostic Analysis for Analog Circuit Faults Based on Cuckoo Search Algorithm and BP Neural Network
A1  - Yi, LingZhi
A1  - Liu, Yue
A1  - Yu, WenXin
A1  - Xiao, Weihong
Y1  - 2017
PY  - 2017
DA  - 2017/06/02
N1  - doi: 10.12691/ajeee-5-3-5
DO  - 10.12691/ajeee-5-3-5
T2  - American Journal of Electrical and Electronic Engineering
JF  - American Journal of Electrical and Electronic Engineering
JO  - American Journal of Electrical and Electronic Engineering
SP  - 102
EP  - 107
VL  - 5
IS  - 3
PB  - Science and Education Publishing
SN  - 2328-7357
M3  - doi: 10.12691/ajeee-5-3-5
UR  - http://pubs.sciepub.com/ajeee/5/3/5
Y2  - 2017/06/02
ER  -