%0 Journal Article
%T AFLISR Algorithm Distribution Reliability Fault
%A Sachan, Amit
%A Ranjan, Ashish
%J American Journal of Electrical and Electronic Engineering
%V 3
%N 1
%P 17-21
%D 2015
%@ 2328-7357
%M doi:10.12691/ajeee-3-1-4
%U http://pubs.sciepub.com/ajeee/3/1/4