Science and Education Publishing American Journal of Electrical and Electronic Engineering 2328-7357 1 3 2013 11 21 By-emitter Emulation Enhancement Tool Using a Global Thermal Solver for the Degradation Emulation of a Calibrated 975 nm Tapered Laser Bar 60 63 EN Christian Kwaku Amuzuvi Department of Electrical and Electronic Engineering, University of Mines and Technology, Tarkwa, Ghana Joseph Cudjoe Attachie Kofi Asante AJEEE2013135 10.12691/ajeee-1-3-5 2013 08 23 2013 11 15 2013 11 21 In this paper, Barlase has been taken a step further by emulating the degradation processes in high power semiconductor laser bars using an upgraded version of Barlase by the introduction of a global thermal solver to further deepen the understanding of the behaviour of laser bars. In this paper, the emulation of a real laser bar was investigated to emulate experimental results by simulating the experimental results in the view of finding a correlation between them. The results established show a more elaborate frown shaped power/current profile and a corresponding frown shaped temperature profile especially at the front facet of the laser bar. Even though a more elaborate frown shaped profile was realised in the power, current and temperature profiles, it fell short from what was seen in the experimental results. As the emulation of laser bar degradation has not been attempted before, further work is needed to achieve better agreement in the output power, current and temperature profiles to better the model.