@article{ajams2018644,
author={{J, Vennila and S, Devaraj Arumainayagam},
title={Quick Switching System with Different Reference Plans},
journal={American Journal of Applied Mathematics and Statistics},
volume={6},
number={4},
pages={141--148},
year={2018},
url={http://pubs.sciepub.com/ajams/6/4/4},
issn={2328-7292},
abstract={A new sampling inspection system with normal single sampling plan and tightened double sampling plan is introduced. Advantages of this system are highlighted.},
doi={10.12691/ajams-6-4-4}
publisher={Science and Education Publishing}
}