American Journal of Electrical and Electronic Engineering
ISSN (Print): 2328-7365 ISSN (Online): 2328-7357 Website: http://www.sciepub.com/journal/ajeee Editor-in-chief: Naima kaabouch
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American Journal of Electrical and Electronic Engineering. 2014, 2(3), 117-120
DOI: 10.12691/ajeee-2-3-9
Open AccessArticle

Further Investigations into the Effects of Temperature on a 975 nm Tapered Laser Bar Using Convolution to Ascertain the Dominant Effect of Temperature on a Laser Bar

Christian Kwaku Amuzuvi1, 2, and Kofi Asante1

1University of Mines and Technology, Department of Electrical and Electronic Engineering, Tarkwa, Ghana

2Photonic and Radio Frequency Engineering Group (PRFEG), Electrical Systems and Optics Research Division, Faculty of Engineering, University of Nottingham, Nottingham, NG7 2RD, United Kingdom

Pub. Date: May 28, 2014

Cite this paper:
Christian Kwaku Amuzuvi and Kofi Asante. Further Investigations into the Effects of Temperature on a 975 nm Tapered Laser Bar Using Convolution to Ascertain the Dominant Effect of Temperature on a Laser Bar. American Journal of Electrical and Electronic Engineering. 2014; 2(3):117-120. doi: 10.12691/ajeee-2-3-9

Abstract

Temperature continues to be an issue in the reliability of high power laser diodes. Any effort, therefore, made to understand the dynamics of temperature on the performance of laser diodes is important. This is because it serves as a catalyst for the generation of nonradiative recombination centers, which ultimately kills laser diodes. In this paper, the convolution of simulation results was done to compare it with experimental results, which revealed more details that hitherto, could not have been captured by experiments alone. The inability of experiments to capture these details is due to the limited spatial resolution of the charged-coupled device (CCD) camera, which is approximately 30 μm much larger than the thickness of the quantum well active region used in the experiment. The convolution results showed a further smile-shaped profile within the four groups of array emitters, which in the experimental results, were considered as one emitter due to the limited spatial resolution of the CCD camera. The use of convolution to determine more details was investigated, due to the dominant effect of temperature found across the output power distribution of high power semiconductor laser diode bars.

Keywords:
by-emitter emitter quantum well defect non-radiative recombination degradation temperature thermal crosstalk spatial resolution convolution interpolation charged-coupled device camera

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References:

[1]  Overton, G., S. G. Anderson, D. A. Belforte, and T. Hausken, Laser Focus World, 47, 40 (2011).
 
[2]  Horn, W., Laser Tech. J., 4, 62 (2007).
 
[3]  Menzel, U., R. Puchert, A. Barwolff, and A. Lau, Microelectron. Reliab., 38, 821 (May 1998).
 
[4]  Xia, R., E. C. Larkins, I. Harrison, S. R. A. Dods, A. V. Andrianov, J. Morgan, and J. P. Landesman, IEEE Photon. Technol. Lett., 14, 893 (2002).
 
[5]  Tomm, J. W., A. Gerhardt, T. Elsaesser, D. Lorenzen, and P. Hennig, Appl. Phys. Lett., 81, 3269 (2002).
 
[6]  Bull, S., J. W. Tomm, M. Oudart, J. Nagle, C. Scholz, K. Boucke, I. Harrison and E. C. Larkins, J. Appl. Phys., 98, 063101 (2005).
 
[7]  Amuzuvi, C. K., Bull S., Tomm J.W., Nagle J., Larkins E. C., Sumpf B., Erbert G., Michel N., and Krakowski M., “The impact of temperature and packaging-induced strain on current competition and emitter power in laser bars” Applied Physics Letter, June 2011.
 
[8]  Amuzuvi, C. K., 2013. Emulation and By-Emitter Degradation Analysis of High Power Lasers: Lap Lambert Academic Publishing, Saarbrücken, Germany.
 
[9]  Heinz Stockinger, Flavia Donno, Erwin Laure, Shahzad Muzaffar, Peter Kunszt. “CERN Grid Data Management in Action: Experience in Running and Supporting Data Management Services in the EU DataGrid Project”, European Organization for Nuclear Research, 2003.
 
[10]  J. Tomm and J. Jiménez, Quantum-Well Laser Array Packaging, McGraw-Hill Professional; 1 edition (2006).